Author:
Wang Yu,Zhou Chuxiang,Xu Jie
Abstract
Abstract
AFM (Atomic force microscope) has been used to measure the surface topography and electrochemical properties of the sample by the interaction between the tip on the cantilever and the sample. However, when there is a charge in the sample, an induced charge will be generated inside the tip, which will generate a new attractive force between the tip and the sample and reduce the amplitude of the tip. We found that the average amplitude of the tip decreased by about 1 nm in tapping mode AFM. As the amplitude decreasing, AFM keeps the amplitude constant by adjusting z0 with negative feedback in tapping mode. So, the average charge density will affect the measurement of surface topography.
Subject
General Physics and Astronomy
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