Author:
El-Kameesy S U,Salama E,Ghannam M M,Roshdy S
Abstract
Abstract
The fluorescence and light absorption and dielectric characteristics of wheat are studied to investigate the influence of gamma exposure on germination, morphological and physical properties of wheat plant. Wheat grains were irradiated at 0, 1.5, 2, 2.5, 3, 5, 7 and 10 krad. The obtained results indicated that, pronounced increase in germination rate, plant height, and root length were obtained at 2.5 krad treatment. Furthermore, those characteristics were evaluated for chlorophyll at different doses given to wheat grains. The analysis of these spectra indicates that the maximum emission and absorption obtained at 2.5 krad gamma irradiation dose. Moreover, the dielectric properties and the electric conductivity of the different irradiated samples were determined in the frequency range 20 Hz- 100 kHz. The obtained data were treated precisely to determine the dielectric constant and the Ac conductivity that easily describe the plant growth. The predictions of the obtained results give further support for the 2.5 krad to be the best dose to stimulate the plant growth features.
Subject
General Physics and Astronomy
Cited by
2 articles.
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