Fault Diagnosis of Analog Circuits Based on The Sailfish Algorithm Optimized SKELM

Author:

Ding Ming,Ma Runping

Abstract

Abstract In view of the long training time for the optimization of the network model parameters of the SELM and the uncertainty of the model generalization ability, this paper proposes an analog circuit fault diagnosis model based on the sailfish algorithm to optimize the stacked kernel extreme learning machine(SKELM). This model introduces a kernel function to build a multi-layer KELM, which can improve the generalization ability and learning speed of the feedforward neural network. The weights of each layer of SKELM are obtained through the automatic encoder training based on the KELM. Since KELM-AE does not need to set initial parameters, the training speed is improved. However, the kernel parameters and regularization coefficients of KELM-AE are set manually, so the sailfish optimizer (SFO) is used to optimize these two parameters, and then the optimal SKELM model is built through layer by layer training. Finally, the Leap frog filter circuit is used as the simulation experiment circuit, and further compared with the optimized SELM. The results show that KELM-AE has strong generalization ability, and it can map fault features to high-dimensional feature space through nonlinear mapping without extracting fault features separately, thus improving the classification accuracy.

Publisher

IOP Publishing

Subject

Computer Science Applications,History,Education

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