In-situ investigation of Bi thin film condensation by surface sensitive X-ray absorption spectroscopy at cryogenic temperatures-Reference-Cited by-同舟云学术

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In-situ investigation of Bi thin film condensation by surface sensitive X-ray absorption spectroscopy at cryogenic temperatures

Published:2009-11-01 Issue: Volume:190 Page:012114
ISSN:1742-6596
Container-title:Journal of Physics: Conference Series
language:
Short-container-title:J. Phys.: Conf. Ser.

Author:

Lützenkirchen-Hecht D,Markert C,Wagner R,Frahm R

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

http://stacks.iop.org/1742-6596/190/i=1/a=012114/pdf

Reference20 articles.

1. Experimental determination of the transport coefficients of bismuth in the range 1·5–50 K

2. An experimental investigation on weak localisation, spin-orbit and interaction effects in thin bismuth films

3. Einflu� der Kondensation bei tiefen Temperaturen auf den elektrischen Widerstand und die Supraleitung f�r verschiedene Metalle

4. Elektronenbeugungs-Aufnahmen von d�nnen Metallschichten bei tiefen Temperaturen

5. Superconductivity of vacuum-deposited bismuth films

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1. Reflection XAFS;XAFS Techniques for Catalysts, Nanomaterials, and Surfaces;2016-10-20

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