XRD study of ceria stabilized zirconia (CSZ) microsphere synthesized by external gelation

Abstract

Abstract Ceria stabilized zirconia microsphere has been synthesized by external gelation. XRD investigations were carried out at each thermal treatment to study the process of zirconia oxide formation. The diffraction patterns at thermal treatment 60°C, 120°C and 200°C still appeared to be broadening because there were still amorphous hydrocarbon compounds. The peak of diffraction started to look at 400°C although it was always broadening, this was because the oxide has begun to form but has not crystallized. Perfect crystallization appears on heat treatment at 1200°C as the tetragonal ZrO2 phase.