Study on IMC Growth Law of Solder Joints in Aerospace Electronic Products and Its Influence on Reliability

Author:

Li Zhan,Yang Yiqing,Huang Wei,Gong Yubing,Pan Kailin

Abstract

Abstract In order to better understand the influence degree of temperature curve parameters on the growth characteristics of intermetallic compounds (IMC) in solder joints during reflux welding, the influence of different temperature curve parameters on the thickness of IMC in Sn63Pb37 solder joints was explored based on the orthogonal test method. A multiple regression model was established for each parameter and the thickness of IMC. In addition, the results show that: (1) The influence degree of temperature curve parameters on IMC thickness in descending order is the highest temperature, liquidus time, cooling time and cooling rate. (2) The coefficient of the established multiple regression model is R2=0.70391. In this model, the IMC thickness increases with the increase of the maximum reflow temperature and liquidus time and decreases with the increase of the cooling time. (3) When the thickness of IMC is 1 μm- 4 μm, the thermal shock reliability of solder joints decreases with the increase of IMC thickness.

Publisher

IOP Publishing

Subject

Computer Science Applications,History,Education

Reference6 articles.

1. Investigation on the high-temperature mechanical fatigue failure behaviour of SnAgCu/Cu solder joint;Zhu;Journal of Materials Science Materials in Electronics,2014

2. Effect of hold time on the mechanical fatigue failure behaviour of lead-free solder joint under high temperature;Zhu;Journal of Materials Science: Materials in Electronics,2014

3. Damage Evolution in Lead-Free Solder Joints in Isothermal Fatigue;Qasaimeh;Journal of Electronic Packaging,2015

4. Numerical simulation and fatigue life estimation of BGA packages under random vibration loading;Liu;Microelectronics Reliability,2015

5. Prediction of fatigue life of spot-welding specimen by structural stress method;Yang;Electric Welding Machine,2016

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3