Delocalization of thefelectron in CexLa1−xRu2Si2- the de Haas-van Alphen effect measurement-Reference-Cited by-同舟云学术

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Delocalization of thefelectron in CexLa1−xRu2Si2- the de Haas-van Alphen effect measurement

Published:2012-12-14 Issue: Volume:391 Page:012042
ISSN:1742-6588
Container-title:Journal of Physics: Conference Series
language:
Short-container-title:J. Phys.: Conf. Ser.

Author:

Matsumoto Y,Kimura N,Komatsubara T,Aoki H,Kurita N,Terashima T,Uji S

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

http://stacks.iop.org/1742-6596/391/i=1/a=012042/pdf

Reference10 articles.

1. Evolution of Fermi Surface Properties in CexLa1-xB6 and PrxLa1-xB6

2. 4f-Electron Localization inCexLa1−xMIn5withM=Co, Rh, or Ir

3. Metamagnetic-like transition in CeRu2Si2?

4. Transition offelectron nature from itinerant to localized: Metamagnetic transition inCeRu2Si2studied via the de Haas–van Alphen effect

5. Delocalization of the f Electron in CexLa1-xRu2Si2

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fermi Surface Properties, Metamagnetic Transition and Quantum Phase Transition of CeRu2Si2 and Its Alloys Probed by the dHvA Effect;Journal of the Physical Society of Japan;2014-07-15

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