Author:
Xie Tang Yao,Wu Zeng Liang,Wang Yun,Yu Jian Guo
Abstract
Abstract
The design of digital systems in modern communication systems, network transmission systems, and computer multimedia systems has developed by leaps and bounds. The speed and accuracy of the interface circuit between analog and digital have become the key and bottleneck for the vigorous development of digital systems in the future. Correspondingly, the requirements for high-precision ADC performance testing technology and functional verification schemes are also getting higher and higher, and they have gradually been upgraded to an important technical obstacle that needs to be resolved, blocking the innovation of information technology in my country. This thesis first briefly introduces the static and dynamic test principles and techniques of high-precision ADC chips, summarizes the performance indicators of ADCs, and expounds the definitions of commonly used test parameters in more detail. Subsequently, modular equipment was used to build a high-performance test platform and a functional verification platform, and a software and hardware test platform was built with PXI modular equipment as the core to complete the system debugging and data processing of each part. The static parameters, Dynamic parameter indicators are measured and analyzed. The test verification system and research program of this program show that it meets the key index test and functional characteristic verification of high-precision ADC, and its test method has good flexibility, completeness, programmability, and versatility.
Subject
General Physics and Astronomy
Reference10 articles.
1. Research on high-performance ADC chip testing technology [J];Wang;China Integrated Circuits,2018
2. Research on the localization of my country’s integrated circuit equipment [J];Zhang;Electronic Measurement Technology,2019
3. The latest development of high-speed ADC interface technology [J];Qian;Electronics and Packaging,2014
4. Software radio broadband multi-channel digital receiving technology based on FPGA [J];Huang;Science Technology and Engineering,2009
5. The influence and analysis of jitter on high-performance ADC test results in ATE test [J];Yu;Electronic Technology Application,2016
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. On-chip Self-test Solutions for ADC survey and analysis;2023 IEEE 8th International Conference on Recent Advances and Innovations in Engineering (ICRAIE);2023-12-02