Magnetoimpedance effect in symmetry and non-symmetry multilayers [Ni80Fe20/Cu]x/Cu/[Ni80Fe20/Cu]6-x on PCB Cu substrate

Abstract

Abstract The effect of magnetoimpedance (MI) on the multilayers [Ni80Fe20/Cu]x/Cu/[Ni80Fe20/Cu]6-x system i.e., symmetry (x = 3) and non-symmetry (x = 5) with the same total of thickness has been investigated. The multilayer samples were deposited on the meandered PCB Cu substrates by the electrodeposition methods. Whereas the MI ratio is carried out by the total impedance measurement at the frequency of 100 kHz under the sequence of magnetic fields. The MI measurements result show that the symmetry structure has a much larger MI ratio compared to non-symmetry structure. The open-magnetic flux configuration of the non-symmetry structure contributes to the lower MI ratio. Finally, the increase of the MI ratio with the increase of frequency is also confirmed in this experiment.