Validation of nuclear reaction models relevant to cosmic-ray neutron induced single-event effects in microelectronics-Reference-Cited by-同舟云学术

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Validation of nuclear reaction models relevant to cosmic-ray neutron induced single-event effects in microelectronics

Published:2011-09-23 Issue:6 Volume:312 Page:062004
ISSN:1742-6596
Container-title:Journal of Physics: Conference Series
language:
Short-container-title:J. Phys.: Conf. Ser.

Author:

Abe Shin-ichiro,Watanabe Yukinobu,Hirayama Shusuke,Sano Nobuyuki,Tosaka Yoshiharu,Tsutsui Masafumi,Furuta Hiroshi,Imamura Takeshi

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

http://stacks.iop.org/1742-6596/312/i=6/a=062004/pdf

Reference21 articles.

1. Analysis of the (N,xN′) reactions by quantum molecular dynamics plus statistical decay model

2. Statistical analysis of light fragment production from medium energy proton-induced reactions

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Production of an 15 O beam using a stable oxygen ion beam for in-beam PET imaging;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2017-03

2. Analytical Model for Estimating the Zenith Angle Dependence of Terrestrial Cosmic Ray Fluxes;PLOS ONE;2016-08-04

3. Analytical Model for Estimating Terrestrial Cosmic Ray Fluxes Nearly Anytime and Anywhere in the World: Extension of PARMA/EXPACS;PLOS ONE;2015-12-16

4. Impact of Nuclear Reaction Models on Neutron-Induced Soft Error Rate Analysis;IEEE Transactions on Nuclear Science;2014-08

5. Nuclear Reaction Models Responsible for Simulation of Neutron-induced Soft Errors in Microelectronics;Nuclear Data Sheets;2014-06

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