Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing-Reference-Cited by-同舟云学术

Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing

Published:2017-06 Issue: Volume:849 Page:012043
ISSN:1742-6588
Container-title:Journal of Physics: Conference Series
language:
Short-container-title:J. Phys.: Conf. Ser.

Author:

Barnard Harold S.,MacDowell A.A.,Parkinson D.Y.,Mandal P.,Czabaj M.,Gao Y.,Maillet E.,Blank B.,Larson N.M.,Ritchie R.O.,Gludovatz B.,Acevedo C.,Liu D.

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

http://stacks.iop.org/1742-6596/849/i=1/a=012043/pdf

Reference14 articles.

1. Real-time quantitative imaging of failure events in materials under load at temperatures above 1,600 °C

2. Tensile testing of materials at high temperatures above 1700 °C with in situ synchrotron X-ray micro-tomography

3. Waveform-based selection of acoustic emission events generated by damage in composite materials

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