Photocathode performance characterisation of ultra-thin MgO films on polycrystalline copper

Abstract

Abstract The performance expected from the next generation of electron accelerators is driving research into photocathode technology as this fundamentally limits the achievable beam quality. The performance characteristics of a photocathode are most notably: normalised emittance, brightness and energy spread. Ultra–thin oxide films on metal substrates have been shown to lower the work function (WF) of the surface, enhancing commonly utilised metal photocathodes, potentially improving lifetime and performance characteristics. We present the characterisation of two MgO/Cu photocathodes grown at Daresbury. The surface properties such as: surface roughness, elemental composition and WF, have been studied using atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS). The photoemissive properties have been characterised with quantum efficiency (QE) measurements at 266 nm. Additionally, we measure the Transverse Energy Distribution Curves (TEDC) for these photocathodes under illumination at various wavelengths using ASTeC’s Transverse Energy Spread Spectrometer (TESS) and extract the Mean Transverse Energy (MTE).