Complementary spectroscopy of tin ions using ion and electron beams
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/163/i=1/a=012071/pdf
Reference19 articles.
1. EUV Sources for Lithography
2. Characterization of a vacuum-arc discharge in tin vapor using time-resolved plasma imaging and extreme ultraviolet spectrometry
3. Comparison of experimental and simulated extreme ultraviolet spectra of xenon and tin discharges
4. Analysis of the 4d7-4d65p transition array of the eighth spectrum of tin: Sn VIII
5. Statistics and characteristics of xuv transition arrays from laser-produced plasmas of the elements tin through iodine
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1. EUV spectroscopy of highly chargedSn13+−Sn15+ions in an electron-beam ion trap;Physical Review A;2020-06-15
2. Optical spectroscopy of complex open-4d-shell ionsSn7+–Sn10+;Physical Review A;2017-04-10
3. Analysis of the fine structure ofSn11+–Sn14+ions by optical spectroscopy in an electron-beam ion trap;Physical Review A;2016-07-07
4. EUV emission spectra of iron ions following charge exchange collisions with He;Physica Scripta;2011-06-01
5. Detailed investigations on radiative opacity and emissivity of tin plasmas in the extreme-ultraviolet region;Physical Review E;2010-08-27
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