Diagnostics and reliability of current receivers

Author:

Mizaev M M,Malozyomov B V,Halikov I H

Abstract

Abstract The most vulnerable element of modern electric buses, which are dynamically charged, are pantographs. The article describes the main reasons for the wear and tear of pantographs. The calculation of the probability of failure-free operation of the pantograph systems is made.

Publisher

IOP Publishing

Subject

General Physics and Astronomy

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