Author:
Trinh V B,Zhong Y,Osipov S P,Batranin A V
Subject
General Physics and Astronomy
Cited by
1 articles.
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1. Computational-Heuristic Algorithm for Tomographic Solution of Industrial Flaw Detection Problems;2023 IEEE XVI International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering (APEIE);2023-11-10