Terahertz probe assisted failure mechanism analysis of silver nanowire film heaters under high working power

Abstract

Abstract The silver nanowire film heaters have the breakdown problem under high working power. It is related with the Rayleigh instability of the silver nanowires and with the electromigration of silver atoms under high electric field localized within nanowire diameter due to the percolation conduction of the silver nanowire films. During the instability of the two structures, the carrier is confined to the nanostructure and suffers different backscattering, which is studied by non-contact Terahertz (THz) spectroscopy. In this paper, structural collapse of heaters presented by THz spectroscopy is to be studied in depth, and the Rayleigh instability and electromigration on device failure are paid attention to by extracting the characteristic parameters of THz time domain spectroscopy and by evaluating the changing trend of the characteristic parameters during device failure. Failure mechanism of heaters under high working power is to be revealed and countermeasures are to be developed. The implementation of this project could drive forward further research on intelligent heaters, which is valuable for scientific research and industrial applications.