Mathematical modeling of nanomachining with atomic force microscope cantilevers
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/490/i=1/a=012161/pdf
Reference19 articles.
1. Atomic Force Microscope
2. Surface analysis of nanomachined films using atomic force microscopy
3. Characterization and analysis of weld lines on micro-injection moulded parts using atomic force microscopy (AFM)
4. Step response measurement of AFM cantilever for analysis of frequency-resolved viscoelasticity
5. Effects of AFM-based nanomachining process on aluminum surface
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Periodic solutions of a tapping mode cantilever in an Atomic Force Microscope with harmonic excitation;Communications in Nonlinear Science and Numerical Simulation;2022-07
2. Nanobeams and AFM Subject to Piezoelectric and Surface Scale Effects;Advances in Mathematical Physics;2018-10-18
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