Simultaneous in-situ x-ray beam profile and intensity measurements with a minimally invasive pixelated diamond monitor

Abstract

Abstract Measuring x-ray beam position, profile, and intensity at synchrotron beamlines provides valuable information for all experiments. Sydor’s transparent x-ray camera (TXC), based on technology originally developed at Brookhaven National Laboratory[1], enables these measurements in-line with experiments for live feedback. The TXC has a low beam profile that fits within a standard vacuum flange width and is composed of diamond material for > 90% transmission of > 5 keV x-rays, minimizing disruption of beamline space and the x-ray beam itself. Standard device parameters include 32 x 32, 60 µm pitch pixels, linearity over a 107 – 1016 photons/s dynamic imaging range, < 40 pA noise floor, and total flux measurement mode. Device performance has been evaluated using a pinhole mask with a benchtop silver x-ray tube and during beam focusing tests at the XFP beamline at NSLS-II and flux characterization at the FAST beamline at CHESS. This work will highlight the features of this commercial beam diagnostic, test results, and future directions and applications of the technology.