Nanoobject mass measurement using the node displacement of the second mode of the nanomechanical resonator

Abstract

Abstract This work suggests a new approach to weighting the nanoscale objects placed at the tip of cantilever vibrating inside the camera of scanning electron microscope. In contrast to traditional approach to mass determination, we suggest tracing the shift of the node of the second vibration mode as an alternative to frequency shift measurement. We demonstrate the applicability of our approach to carbon nanowhisker cantilevers grown on tungsten needles by focused electron beam induced deposition. We compare experimentally the performance of the suggested approach with the traditional frequency shift-based method.