Author:
Butukhanov V P,Lomukhin Ju L,Atutov E B
Abstract
Abstract
The work is devoted to the study of the structure of waves excited in bordering media under radar irradiation of both smooth and rough interfaces. It is found that counter propagating waves are excited in bordering absorbing media, which determine backward reflection at the interface. On the other hand, the reflection of the counter propagating wave excites waves with a negative angle of refraction. It was found in this work that when the interface is irradiated with a plane wave during polarization, when the electric field strength vector lies in the plane of incidence, the backward reflection and the refracted wave are increases, and the specular reflection decreases. Electrodynamics models of the back reflection coefficients are developed for both the case of smooth and for the case of uneven interfaces between the media.
Subject
General Physics and Astronomy