Steady-state photocarrier grating technique for the minority-carrier characterisation of thin-film semiconductors
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/253/i=1/a=012081/pdf
Reference47 articles.
1. Steady‐state photocarrier grating technique for diffusion length measurement in photoconductive insulators
2. Ambipolar drift-length measurement in amorphous hydrogenated silicon using the steady-state photocarrier grating technique
3. Steady‐state photocarrier grating technique for diffusion‐length measurement in semiconductors: Theory and experimental results for amorphous silicon and semi‐insulating GaAs
4. Diffusion Lengths in a-SiGe:H and a-SiC:H Alloys from Optical Grating Technique
5. Mobility‐lifetime products in CuGaSe2
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