VUV diagnostics of electron impact processes in low temperature molecular hydrogen plasma-Reference-Cited by-同舟云学术

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VUV diagnostics of electron impact processes in low temperature molecular hydrogen plasma

Published:2015-07-08 Issue:4 Volume:24 Page:045008
ISSN:0963-0252
Container-title:Plasma Sources Science and Technology
language:
Short-container-title:Plasma Sources Sci. Technol.

Author:

Komppula J,Tarvainen O

Funder

EU 7th framework programme ‘Integrating Activities—Transnational Access‘

Academy of Finland under the Finnish Centre of Excellence Programme 2012- 2017 (Nuclear and Accelerator Based Physics Research at JYFL)

Publisher

IOP Publishing

Subject

Condensed Matter Physics

Link

http://stacks.iop.org/0963-0252/24/i=4/a=045008/pdf

Reference46 articles.

1. Volume production negative hydrogen ion sources

2. High‐concentration H2+ or D2+ ion source

3. Testing of a H2+‐enriched ion source for deuterium simulation

4. Ion source issues for the DAEδALUS neutrino experiment

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