Investigation of boron distribution and material migration on the W7-X divertor by picosecond LIBS

Author:

Zhao DORCID,Brezinsek SORCID,Yi RORCID,Oelmann JORCID,Cai LORCID,Wu F,Sergienko GORCID,Rasinski MORCID,Mayer MORCID,Dhard C P,Naujoks D

Abstract

Abstract One set of horizontal target elements of the Test Divertor Units (TDU), retrieved from the Wendelstein 7-X (W7-X) vessel after the end of second divertor Operation Phase (OP1.2B) in Hydrogen (H), were investigated by picosecond Laser-Induced Breakdown Spectroscopy (ps-LIBS). The Boron (B) distribution, H pattern and the material erosion/deposition pattern on these target elements were analyzed with high depth resolution and mapped in the poloidal direction of W7-X. From the spectroscopic analysis, B, H, Carbon (C) and Molybdenum (Mo) were clearly identified. A non-uniformly distributed B pattern on these divertor target elements was determined by the combination of B layer deposition during the three boronizations and W7-X plasma operation with multiple erosion and deposition steps of B. Like the TDU, the analyzed target elements are made of fine grain graphite, but have two marker layers which allow us to determine the material migration via the ps-LIBS technique. Two net erosion zones including one main erosion zone with a peak erosion depth of 6.5 μm and one weak erosion with a peak erosion of 1.3 μm were determined. Between two net erosion zones, a net deposition zone with width of 135 mm and a thickness up to 3.5 μm at the peak deposition location was determined by the ps-LIBS technique. The B distributions are correlated with the erosion/deposition pattern and the operational time in standard magnetic configuration of W7-X in the phases after the boronizations. The thickness of the containing B layer on these target elements also correlates with the erosion/deposition depth, in which the thickness of the containing B layer varies spatially in poloidal direction between 0.1 μm and 6 μm. Complementary, Focused Ion Beam combined with Scanning Electron Microscopy (FIB-SEM) was employed also to verify and investigate the deposition layer thicknesses at typical net erosion and net deposition zones as well as to identify the three boronizations in depth.

Funder

National Natural Science Foundation of China

Publisher

IOP Publishing

Subject

Condensed Matter Physics,Mathematical Physics,Atomic and Molecular Physics, and Optics

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