Abstract
Abstract
The influence of the stacking order and of an additional Ag layer on the formation of ordered phases in thin (< 50 nm) layered Fe/Pd and Fe/Ag/Pd films was investigated at 460 °C. The samples were prepared by magnetron sputtering at room temperature on Si/SiO2 substrate and were post-annealed in vacuum. Composition depth profiling and x-ray diffraction were used to characterize the processes. It has been shown, that the stacking order strongly influences the formation of ordered phases both in Fe/Pd bilayered and Fe/Ag/Pd trilayered films. In bilayered Fe/Pd films for both stacking orders the FePd3 phase appeared and it also showed L12 ordering for one stacking order. Addition of Ag layer between the Fe and Pd layers found to promote the formation of FePd phase which showed L10 ordering or A1 disordered structure depending on stacking order. Based on the analysis of the chemical depth profiles and XRD patterns the transformations were interpreted by grainboundary diffusion mechanisms including grainboundary diffusion induced grainboundary migration and solid state reaction.