Role of morphology and composition in the transport properties of highly conducting CVD grown PtTex

Abstract

Abstract Platinum telluride (PtTex), a metallic noble transition-metal dichalcogenide, has emerged as a central candidate for magnetic and optoelectronic applications. Recently, PtTex has drawn great attention because of its large positive magnetoresistance and broadband photodetection owing to its astounding electron transport properties. Here, we report the role of morphology, texture, and composition in the transport properties of CVD-grown highly conducting PtTex. Two different compositions of Te atoms, named tellurium stoichiometric (TS) and tellurium rich (TR), with different morphology have been obtained in the PtTex films. The highest longitudinal conductivity was found to be ∼ 3.57 × 107 and 3.83 × 106 S m−1 at 200 K in the TR and TS-PtTex samples, respectively. The maximum carrier density in TR and TS-PtTex samples was found to be of the order of 1022 and 1021 cm−3, respectively. Further, the negative magnetoresistance has also been found to be ∼ −2.2% at 300 K in the presence of an in-plane magnetic field of 9 T. Our results, reporting extremely high conductivity along with negative magnetoresistance, promise exciting applications of PtTex for nanoelectronic devices.