Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh–Rice theory
Author:
Funder
Ministry of Education, Youth and Sports of Czech Republic
Publisher
IOP Publishing
Subject
Condensed Matter Physics,Mathematical Physics,Atomic and Molecular Physics, and Optics
Link
http://iopscience.iop.org/article/10.1088/1402-4896/aafbc1/pdf
Reference27 articles.
1. Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
2. Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method
3. Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory
4. Spectroscopic ellipsometry characterization of ZrO[sub 2] films on Si(100) deposited by high-vacuum-metalorganic chemical vapor deposition
5. Structural and interfacial properties of large area n-a-Si:H/i-a-Si:H/p-c-Si heterojunction solar cells
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