Abstract
Abstract
A high-speed emittance measurement system installed at the J-PARC RF negative hydrogen (H-) ion source test stand can construct emittance diagrams of the beam of a specific frequency component. The driving 2 MHz RF power produces small amplitude oscillating components at 2 MHz and at higher harmonic frequencies in the total H- ion beam detected by a Faraday installed downstream of the emittance measurement system. Magnitudes of oscillating component at 2 MHz and 4 MHz frequencies become appreciable as the slits of the emittance measurement system separate the H- ion beam into the position/angle resolved phase space elements. The reconstructed emittance diagrams of H- ion beams for the operation condition with continuous supply of Cs realizing large H- ion current to total extraction current ratios indicate that 2 MHz and 4 MHz frequency oscillating beam components propagate surrounding the center DC beam. Both 2 MHz and 4 MHz oscillating beam components comprise two to three beam particle groups in the phase space. The DC component of the H- ion beam exhibit a single peak in the angular distribution. Meanwhile, oscillating components often take the minima where the DC H- ion beam takes the maximum in the angular distribution diagram. Thus, the regions that produce large amplitude oscillations of the H- ion beam are considered located at the circumference of the beam extraction aperture. One possible explanation for observing larger amplitude beam oscillation can be the enhanced H- ion surface production at the plasma facing the wall of the beam extraction aperture. The operation without the Cs delivery to the source increased electron current coextracted with H- ions and changed the structure of the beam emittance diagram. In the direction perpendicular to the magnetic fields created by a magnetic filter and electron suppression magnets, the peak of the 4 MHz oscillating beam components appeared at the center of the DC beam. This observation suggests the extraction of H- ions formed in the central region by the volume production process near the internal RF antenna. Mechanisms that can excite and diminish the beam fluctuation amplitudes of the extracted H- ion beam are discussed.