Author:
Cecconi L.,Piro F.,de Melo J.L.A.,Deng W.,Hong G.H.,Snoeys W.,Mager M.,Suljic M.,Kugathasan T.,Buckland M.,Aglieri Rinella G.,Leitao P.V.,Reidt F.,Baudot J.,Bugiel S.,Colledani C.,Contin G.,Hu C.,Kluge A.,Kluit R.,Vitkovskiy A.,Russo R.,Becht P.,Grelli A.,Hasenbichler J.,Munker M.,Soltveit H.K.,Menzel M.W.,Sonneveld J.,Tiltmann N.
Abstract
Abstract
The Digital Pixel Test Structure (DPTS) is a monolithic active pixel sensor prototype chip designed to explore the TPSCo 65 nm ISC process in the framework of the CERN-EP R&D on monolithic sensors and the ALICE ITS3 upgrade. It features a 32 × 32 binary pixel matrix at 15 μm pitch with event-driven readout, with GHz range time-encoded digital signals including Time-Over-Threshold. The chip proved fully functional and efficient in testbeam allowing early verification of the complete sensor to readout chain. This paper focuses on the design, in particular the digital readout and its perspectives with some supporting results.
Subject
Mathematical Physics,Instrumentation
Cited by
3 articles.
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1. Monolithic CMOS Sensors for high energy physics — Challenges and perspectives;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-11
2. A Compact Front-End Circuit for a Monolithic Sensor in a 65-nm CMOS Imaging Technology;IEEE Transactions on Nuclear Science;2023-09
3. Advancements and applications of monolithic pixel detector;SCIENTIA SINICA Physica, Mechanica & Astronomica;2023-01-01