Characterisation of strip silicon detectors for the ATLAS Phase-II Upgrade with a micro-focused X-ray beam-Reference-Cited by-同舟云学术

Characterisation of strip silicon detectors for the ATLAS Phase-II Upgrade with a micro-focused X-ray beam

Published:2016-07-29 Issue:07 Volume:11 Page:P07023-P07023
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Poley L.,Blue A.,Bates R.,Bloch I.,Díez S.,Fernandez-Tejero J.,Fleta C.,Gallop B.,Greenall A.,Gregor I.-M.,Hara K.,Ikegami Y.,Lacasta C.,Lohwasser K.,Maneuski D.,Nagorski S.,Pape I.,Phillips P.W.,Sperlich D.,Sawhney K.,Soldevila U.,Ullan M.,Unno Y.,Warren M.

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

http://stacks.iop.org/1748-0221/11/i=07/a=P07023/pdf

Reference13 articles.

1. Progress with the single-sided module prototypes for the ATLAS tracker upgrade stave

2. Edge pixel response studies of edgeless silicon sensor technology for pixellated imaging detectors

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