Controlling optics contamination at the PolLux STXM
Author:
Publisher
IOP Publishing
Subject
Mathematical Physics,Instrumentation
Link
http://stacks.iop.org/1748-0221/13/i=04/a=C04001/pdf
Reference36 articles.
1. Carbon contamination of soft X-ray beamlines: dramatic anti-reflection coating effects observed in the 1 keV photon energy region
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4. Modeling radiation-induced carbon contamination of extreme ultraviolet optics
5. Ex-situ characterization of synchrotron radiation induced carbon contamination on LiF window
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