Author:
Xu Zhongfang,Guo Cong,Liu Jincang,Zhang Yongpeng,Zhang Peng,Yang Changgen,Tang Quan,Liu Yu,Li Chi,Guan Tingyu
Abstract
Abstract
Radon and its daughters are one of the most important
background sources for low-background liquid scintillator (LS)
detectors. The study of the diffusion behavior of radon in the LS
contributes to the analysis of the related background caused by
radon. Methodologies and devices for measuring radon's diffusion
coefficient and solubility in materials are developed and
described. The radon diffusion coefficient in the LS was measured
for the first time and the solubility coefficient was also
obtained. In addition, the radon diffusion coefficient in the
polyolefine film which is consistent with data in the literature was
measured to verify the reliability of the diffusion device.
Subject
Mathematical Physics,Instrumentation