Author:
Bulavskaya A.A.,Cherepennikov Yu.M.,Grigorieva A.A.,Miloichikova I.A.,Stuchebrov S.G.
Abstract
Abstract
In this research, a method for acquiring radiation beam
profiles was developed. Multiple linear beam scanning using a
detection strip was performed in a beam cross section at different
angles. The obtained data were then mathematically processed and
transformed into the radiation beam profile. The profiles of X-ray
and electron beams were obtained experimentally using the proposed
method, and are reported herein.
Subject
Mathematical Physics,Instrumentation
Cited by
4 articles.
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