Development of a new Front End electronics in Silicon and Silicon-Germanium technology for the Resistive Plate Chamber detector for high rate experiments-Reference-Cited by-同舟云学术

Development of a new Front End electronics in Silicon and Silicon-Germanium technology for the Resistive Plate Chamber detector for high rate experiments

Published:2019-10-04 Issue:10 Volume:14 Page:C10010-C10010
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Pizzimento L.,Cardarelli R.,Aielli G.,Camelia E. Alunno,Bruno S.,Caltabiano A.,Camarri P.,Ciaccio A. Di,Liberti B.,Massa L.,Rocchi A.

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

https://iopscience.iop.org/article/10.1088/1748-0221/14/10/C10010/pdf

Reference10 articles.

1. Development of resistive plate counters

2. Progress in resistive plate counters

3. RPC performance vs. front-end electronics

4. Performance of RPCs and diamond detectors using a new very fast low noise preamplifier

5. Si/SiGe heterostructures: from material and physics to devices and circuits

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