Arbitrary depth slice imaging based on cone beam x-rays multi-angle sampling

Abstract

Abstract Arbitrary internal depth slice imaging is an effective way to realize rapid industrial scanning and reconstruction method in x-rays imaging. This paper proposes a novel arbitrary internal depth slice imaging (AIDSI) method for cone beam x-rays imaging. AIDSI builds the relationships between voxels of depth slices and pixels of sampling images under the cone beam x-ray source, which serves to refocus sampling data to specified depth slices. To remove artifacts of direct refocusing, a 3-point weighted practical ramp filtering method is used for sparse sampling data. The side lobes of the filter converge fast, artifacts caused by Gibbs effects are effectively reduced compared with common Shepp-Logan and Ram-Lak filters. Additionally, a weighting function is designed to reduce artifacts caused by structures of uninteresting layers. The feasibility and effectiveness of AIDSI is evaluated through simulation and real experiments. Results show that the proposed method has the ability to directly reconstruct arbitrary depth slice images based on random sparse sampling data, which is expected to be used for rapid detection of a large number of samples in industry.