Test signal generator for simulating electron events from a momentum microscope

Abstract

Abstract Preparing experiments that utilize free electron lasers is challenging because obtaining access to the facility is difficult. The integration of detectors into the data acquisition system needs to be tested before the beamtime starts. In this study, we develop a test signal generator that simulates the signals from a delay-line detector used in a time-of-flight electron spectrometer. The output signals of the simulator are connected to the time-to-digital converter electronics and simulate a realistic energy spectrum of a real spectrometer. Through this method, the detector electronics can be tested and integrated into the data acquisition system at the free electron laser before the actual instrument is available on site. In addition, the saturation behavior of the signal processing chain can be tested by changing the number of simulated electrons per pulse.