Experimental characterization of a fast X-ray spectroscopic imager module using the ALTAIR P3 ASIC for real-time contaminants detection

Abstract

Abstract X-ray imagers with spectroscopic capabilities and high photon count rates are finding promising applications in industrial real-time inspection systems. In this context, XSpectra® combines a CdTe-based linear energy-resolved photon counting (ERPC) pixel sensor with real-time image processing techniques to detect low and high density contaminants. The detection unit makes use of a new analog read-out ASIC that has been designed by Politecnico di Milano to meet strict application requirements both in energy resolution and achievable photon count rate. A room-temperature low-rate spectroscopic characterization of the system at a peaking time of 60 ns showed an average equivalent noise charge of 259 electrons r.m.s. (2.72 keV FWHM in CdTe) and an average FWHM of the 59.5 keV 241Am line of 3.6 keV, with a 3σ dispersion in noise performance of ±10% over 256 channels. The detection unit was tested in high incoming photon flux conditions by means of an X-ray tube. Minimal spectral distortion due to pile-up events is obtained up to an Incoming Count Rate of 2.5 Mcps/channel, while the maximum counting capability of energy-resolved events is 2.2 Mcps/channel.