Author:
Ange Joshua,Calkins Robert,Posada Andrew
Abstract
Abstract
Commercial alpha counters are used in science and industry applications to screen
materials for surface radon progeny contamination. In this paper, we characterize an XIA
UltraLo-1800, an ionization drift alpha counter, and study the response to embedded charge in
polyethylene sample measurements. We show that modeling such effects is possible in a Geant4-based
simulation framework and attempt to derive corrections. This paper also demonstrates the
effectiveness of the use of an anti-static fan to eliminate the embedded charge and recover a
97.73% alpha detection efficiency in the alpha counter.
Subject
Mathematical Physics,Instrumentation