A combined approach to the simulation of ionizing radiation effects in silicon devices
Author:
Publisher
IOP Publishing
Subject
Mathematical Physics,Instrumentation
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1. COMBINED SIMULATION METHODOLOGY FOR A COMPLETECHARACTERIZATION OF IONIZING RADIATION EFECTS IN DETECTION DEVICES;Anales AFA;2023-12-28
2. Direct detection of high intensity X-ray fluxes with silicon photomultipliers;Journal of Instrumentation;2019-05-20
3. Geant4-based simulations of charge collection in CMOS Active Pixel Sensors;Journal of Instrumentation;2017-03-29
4. Validation of Geant4 Pixel Detector Simulation Framework by Measurements With the Medipix Family Detectors;IEEE Transactions on Nuclear Science;2016-06
5. Use of CMOS imagers to measure high fluxes of charged particles;Journal of Instrumentation;2016-03-15
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