Testbeam results of irradiated SiGe BiCMOS monolithic silicon pixel detector without internal gain layer

Author:

Moretti T.,Milanesio M.,Cardella R.,Kugathasan T.,Picardi A.,Semendyaev I.,Elviretti M.,Rücker H.,Nakamura K.,Takubo Y.,Togawa M.,Cadoux F.,Cardarelli R.,Cecconi L.,Débieux S.,Favre Y.,Fenoglio C.A.,Ferrere D.,Gonzalez-Sevilla S.,Iodice L.,Kotitsa R.,Magliocca C.,Nessi M.,Pizarro-Medina A.,Sabater Iglesias J.,Saidi J.,Vicente Barreto Pinto M.,Zambito S.,Paolozzi L.,Iacobucci G.ORCID

Abstract

Abstract Samples of the monolithic silicon pixel ASIC prototype produced in 2022 within the framework of the Horizon 2020 MONOLITH ERC Advanced project were irradiated with 70 MeV protons up to a fluence of 1 × 1016 neq/cm2, and then tested using a beam of 120 GeV/c pions. The ASIC contains a matrix of 100 μm pitch hexagonal pixels, read out by low noise and very fast frontend electronics produced in a 130 nm SiGe BiCMOS technology process. The dependence on the proton fluence of the efficiency and the time resolution of this prototype was measured with the frontend electronics operated at a power density between 0.13 and 0.9 W/cm2. The testbeam data show that the detection efficiency of 99.96% measured at sensor bias voltage of 200 V before irradiation becomes 96.2% after a fluence of 1 × 1016 neq/cm2. An increase of the sensor bias voltage to 300 V provides an efficiency to 99.7% at that proton fluence. The timing resolution of 20 ps measured before irradiation rises for a proton fluence of 1 × 1016 neq/cm2 to 53 and 45 ps at HV = 200 and 300 V, respectively.

Publisher

IOP Publishing

Reference23 articles.

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3