Characterization of the ePix100a and the FastCCd semiconductor detectors for the European XFEL
Author:
Publisher
IOP Publishing
Subject
Mathematical Physics,Instrumentation
Link
http://stacks.iop.org/1748-0221/14/i=01/a=C01008/pdf
Reference17 articles.
1. The European X-ray free-electron laser facility in Hamburg
2. Photon Beam Transport and Scientific Instruments at the European XFEL
3. Requirements for and development of 2 dimensional X-ray detectors for the European X-ray Free Electron Laser in Hamburg
4. AGIPD, a high dynamic range fast detector for the European XFEL
5. Development of the DEPFET Sensor With Signal Compression: A Large Format X-Ray Imager With Mega-Frame Readout Capability for the European XFEL
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