Monitoring transverse beam profiles of a Penning ion source using a position-sensitive Multi Array Faraday Cup
Author:
Publisher
IOP Publishing
Subject
Mathematical Physics,Instrumentation
Link
http://stacks.iop.org/1748-0221/10/i=06/a=P06003/pdf
Reference11 articles.
1. Beam diagnostics for low energy beams
2. A low cost ion beam profile monitor
3. Beam Instrumentation and Diagnostics
4. Testing residual gas profiler at SARAF
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Measurement system for ion beam profiles using fixed parallel wires and Faraday cup array;AIP Advances;2022-12-01
2. Measurements of the Ion-Beam Current Distribution over a Target Surface under a High Bias Potential;Instruments and Experimental Techniques;2018-07
3. Comparison of the ion beam profile measuring methods;AIP Conference Proceedings;2018
4. A novel method to survey parameters of an ion beam and its interaction with a target;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-09
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