Author:
Basso M.J.,Fernández-Tejero J.,Gallop B.J.,Greig G.,John J.J.,Keener P.T.,Krizka K.,Leitao P.V.,Norman B.,Phillips P.W.,Poley L.,Sawyer C.,Stack T.L.,Stucci S.,Trischuk D.A.,Warren M.
Abstract
Abstract
Single Event Effects (SEEs) — predominately bit-flips in
electronics caused by particle interactions - are a major concern
for ASICs operated in high radiation environments such as ABCStar
ASICs, which are designed to be used in the future ATLAS ITk strip
tracker. The chip design is therefore optimised to protect it from
SEEs by implementing triplication techniques such as Triple Modular
Redundancy (TMR).
In order to verify the radiation protection mechanisms of the chip
design, the cross-section for Single Event Upsets (SEUs), a
particular class of SEEs, is measured by exposing the chip to
high-intensity particle beams while monitoring it for observed SEUs.
This study presents the setup, the performed measurements, and the
results from SEU tests performed using the latest version of the
ABCStar ASIC (ABCStar V1) using a 480 MeV proton beam.
Subject
Mathematical Physics,Instrumentation
Cited by
2 articles.
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1. Irradiation testing of ASICs for the HL-LHC ATLAS ITk Strip Detector;Journal of Instrumentation;2023-02-01
2. The ATLAS ITk detector system for the Phase-II LHC upgrade;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-01