Proton irradiation of FPGA-embedded hadron fluence sensors

Author:

Giordano R.ORCID,Tortone G.,Vincenzi D.,Loffredo F.,Quarto M.,Pestotnik R.ORCID,Lozar A.,Seljak A.,Verroi E.

Abstract

Abstract Hadron fluence monitors based on static random access memories (SRAMs) are in use at particle accelerators for the protection of electronics and at proton-therapy facilities for measuring secondary neutrons. One shortcoming of current solutions is that they necessitate SRAMs to detect radiation-induced single event upsets and require additional components to transfer the counts from the radiation area. This approach limits the practicality of the sensors due to their power requirements, increased board complexity, larger physical footprint and reduced total ionizing dose tolerance. In this work, we present proton irradiation test results of a novel proton and neutron fluence sensor we designed. The sensor is fully embedded in a SRAM-based field programmable gate array (FPGA) solving the abovementioned limitations of the state of the art. The FPGA configuration SRAM is used as a sensitive element, while the Joint Test Action Group interface is leveraged as a read out circuitry. We irradiated six sensor units by means of a variable-energy proton beam at the Trento Institute for Fundamental Physics and Applications (TIFPA, Trento, Italy). We discuss our results in terms of proton to upset cross section as a function of the proton energy in the range from 70 to 228 MeV, also parameterized with respect to the power supply voltage. We evaluate the variability of the cross section in the set of irradiated samples. Moreover, we show how we used the device to image the proton beam and measure beam profiles for aligning the configuration RAM and beam centers. We also suggest alternate reading modes to measure the fluence on the device by measuring the drawn current, rather than counting upsets.

Publisher

IOP Publishing

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