Measurement of the effect of non ionising energy losses on the leakage current of silicon drift detector prototypes for the LOFT satellite-Reference-Cited by-同舟云学术

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Measurement of the effect of non ionising energy losses on the leakage current of silicon drift detector prototypes for the LOFT satellite

Published:2014-07-11 Issue:07 Volume:9 Page:P07016-P07016
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Monte E Del,Rachevski A,Zampa G,Zampa N,Azzarello P,Bozzo E,Campana R,Diebold S,Evangelista Y,Perinati E,Feroci M,Pohl M,Vacchi A

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

http://stacks.iop.org/1748-0221/9/i=07/a=P07016/pdf

Reference41 articles.

1. Semiconductor drift chamber — An application of a novel charge transport scheme

2. Review of semiconductor drift detectors

3. Performance of the UA6 large-area silicon drift chamber prototype

4. The Large Observatory for X-ray Timing (LOFT)

5. A large area detector proposed for the Large Observatory for X-ray Timing (LOFT)

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4. HERMES-Pathfinder;Handbook of X-ray and Gamma-ray Astrophysics;2022

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