TID and SEU testing of the novel X-CHIP-03 monolithic pixel detector-Reference-Cited by-同舟云学术

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TID and SEU testing of the novel X-CHIP-03 monolithic pixel detector

Published:2020-01-29 Issue:01 Volume:15 Page:C01043-C01043
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Marcisovska M.,Dudas D.,Havranek M.,Kabatova A.,Kafka V.,Kostina A.,Mackova A.,Marcisovsky M.,Mitrofanov S.V.,Popule J.,Romanenko O.,Tomasek L.,Vrba V.

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

https://iopscience.iop.org/article/10.1088/1748-0221/15/01/C01043/pdf

Reference13 articles.

1. MAPS sensor for radiation imaging designed in 180 nm SOI CMOS technology

2. SOI monolithic pixel technology for radiation image sensor

3. X-CHIP-03: SOI MAPS radiation sensor with hit-counting and ADC mode

4. A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. SpacePix3: SOI MAPS detector for space radiation monitoring;Journal of Instrumentation;2023-10-01

2. SpacePix2: SOI MAPS detector for space radiation monitoring;Journal of Instrumentation;2023-01-01

3. Radiation hardness of PantherPix hybrid pixel detector;Journal of Instrumentation;2021-12-01

4. X-ray characterization of BUSARD chip: A HV-SOI monolithic particle detector with pixel sensors under the buried oxide;Journal of Instrumentation;2021-12-01

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