Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution-Reference-Cited by-同舟云学术

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Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution

Published:2020-01-17 Issue:01 Volume:15 Page:P01020-P01020
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Aryshev A.,Ainsworth R.,Aumeyr T.,Bergamaschi M.,Boogert S.T.,Karataev P.,Kieffer R.,Kruchinin K.,Lefevre T.,Mazzoni S.,Nevay L.,Terunuma N.,Urakawa J.

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

https://iopscience.iop.org/article/10.1088/1748-0221/15/01/P01020/pdf

Reference23 articles.

1. Experimental Validation of a Novel Compact Focusing Scheme for Future Energy-Frontier Linear Lepton Colliders

2. Present status and first results of the final focus beam line at the KEK Accelerator Test Facility

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comparison of the Results of Simulation and Measurements of Interference Patterns of Coherent Transition Radiation;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2023-02

2. Comparison of the Results of Simulation and Measurements of Interferograms of Coherent Transition Radiation;Поверхность. Рентгеновские, синхротронные и нейтронные исследования;2023-02-01

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