Author:
Vairac P,Boucenna R,Le Rouzic J,Cretin B
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
7 articles.
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1. Cantilever signature of tip detachment during contact resonance AFM;Beilstein Journal of Nanotechnology;2021-11-24
2. Force Modulation in Atomic Force Microscopy;Encyclopedia of Nanotechnology;2016
3. Force Modulation in Atomic Force Microscopy;Encyclopedia of Nanotechnology;2015
4. Acoustical Near-Field Imaging;Advances in Acoustic Microscopy and High Resolution Imaging;2013-04-12
5. W-Shaped Cantilevers for Scanning Force Microscopy;IEEE Sensors Journal;2013-04