Measuring small lattice distortions in Si-crystals by phase-contrast x-ray topography-Reference-Cited by-同舟云学术

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Measuring small lattice distortions in Si-crystals by phase-contrast x-ray topography

Published:2000-10-17 Issue:21 Volume:33 Page:2678-2682
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Bergamin A,Cavagnero G,Mana G,Massa E,Zosi G

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/33/i=21/a=302/pdf

Reference24 articles.

1. AN X‐RAY INTERFEROMETER

2. Interferometry with x rays

3. Phase‐contrast x‐ray computed tomography for observing biological specimens and organic materials

4. The Possibility of Phase-Contrast X-Ray Microtomography

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Crystal bending in triple-Laue X-ray interferometry. Part II. Phase-contrast topography;Journal of Applied Crystallography;2023-05-12

2. X-ray phase-contrast topography to measure the surface stress and bulk strain in a silicon crystal;Journal of Applied Crystallography;2020-08-14

3. Evaluation of structural and microscopic properties of tetragonal ZrO2for the facet coating of 980 nm semiconductor laser diodes;Journal of Physics D: Applied Physics;2015-02-17

4. X-ray crystal interferometers;Physics-Uspekhi;2014-11-30

5. Measurement of the lattice parameter of a silicon crystal;New Journal of Physics;2009-05-27

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