The stylus or scratch method for thin film adhesion measurement: some observations and comments-Reference-Cited by-同舟云学术

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The stylus or scratch method for thin film adhesion measurement: some observations and comments

Published:1970-06-01 Issue:6 Volume:3 Page:877-883
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Butler D W,Stoddart C T H,Stuart P R

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/3/i=6/a=307/pdf

Reference11 articles.

1. Measurement of adhesion of thin films

2. Shearing of junctions between metal surfaces

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