Nanoprobing of semiconductor heterointerfaces: quantum dots, alloys and diffusion
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/37/i=13/a=R01/pdf
Reference61 articles.
1. Cross-sectional scanning tunnelling microscopy of III-V semiconductor structures
2. Nanoscale characterization of semiconductor materials and devices using scanning probe techniques
3. Cross-Sectional Scanning Tunneling Microscopy
4. Scanning tunneling microscopy of in situ cleaved and hydrogen passivated Si(110) cross-sectional surfaces
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